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IEEE- Workshop on Microelectronics and Electron Devices (WMED)

ABOUT WMED

​Welcome to the Sixteenth Annual IEEE Workshop on Microelectronics and Electron Devices (WMED 2018). WMED is a technical forum for reviewing and discussing all aspects of micro- and nano-electronics including processing, electrical characterization and reliability, design, and new device technologies. This workshop will consist of invited talks, contributed papers, and a poster session throughout the day. Faculty, students, and researchers in industry are encouraged to contribute presentations on either completed research or work-in-progress.

WMED offers a unique opportunity in the Treasure Valley for developing a wide range of professional relationships. The keynote talk, invited lectures, and social events provide an opportunity to interact with the leaders and innovators in your field of interest. Topics in the following areas will form the contributing sessions and poster session in the workshop:

• Microelectronic Device Processing and Process Integration
• Trends in Submicron CMOS technology, Product development (DRAM, SRAM, Flash, CMOS Imagers), new device technologies (Phase Change Memory, Resistive Memory, Ferroelectric Memory), Novel transistors
  
• Nanoelectronic Devices and MEMS
  
• Novel processes, materials and device characterization on nanotubes, nanowires, quantum dots, molecular devices, MEMS research
  
• Microelectronic Device Electrical and Reliability Testing
  
• Dielectric reliability, Device reliability, Novel memory technology testing schemes
  
• Semiconductor Packaging and Reliability
  
• Semiconductor package reliability, Design for Manufacturability, Stacked die packaging and Novel assembly processes
  
• Microelectronic Circuit Design​
  
• New product design, high-speed and/or low-power design techniques and architectures and memory sensing schemes