Workshop on Microelectronics and Electron Devices
March 30th, 2020
Boise State University, Jordan and Simplot Ballrooms
Boise, Idaho, USA
Welcome to the 18th Annual IEEE Workshop on Microelectronics and Electron Devices (WMED 2020). WMED is a technical forum for reviewing and discussing all aspects of micro- and nano-electronics including processing, electrical characterization and reliability, design, and new device technologies. This workshop will consist of invited talks, contributed papers, and a poster session throughout the day. Faculty, students, and researchers in industry are encouraged to contribute presentations on either completed research or work-in-progress.
WMED offers a unique opportunity in the Treasure Valley for developing a wide range of professional relationships. The keynote talk invited lectures, and social events provide an opportunity to interact with the leaders and innovators in your field of interest. Topics in the following areas will form the contributing sessions and poster session in the workshop:
1. Microelectronic Device Processing and Process Integration
Trends in submicron CMOS technology, product development (DRAM, SRAM, Flash, CMOS Imagers), new device technologies (phase-change memory, resistive memory, ferroelectric memory), novel transistors.
2. Nanoelectronic Devices and MEMS
Novel processes, materials and device characterization on nanotubes, nanowires, quantum dots, molecular devices, MEMS research.
3. Microelectronic Device Electrical and Reliability Testing
Dielectric reliability, device reliability, novel memory technology testing schemes.
4. Semiconductor Packaging and Reliability
Semiconductor package reliability, design for manufacturability, stacked die packaging and novel assembly processes.
5. Microelectronic Circuit and System Design
New product design, high-speed and low-power design techniques and system architectures and memory sensing schemes.
Find more on Call For Papers details Here. Please feel free to pass this information to all those who may be interested in participating in WMED.